Information about the equipment
Manufacturer: Agilent Technologies, typ 5150 SVDV ICP-OES
The ICP-OES (Inductively Coupled Plasma Emission Spectrometer) is capable of determining trace and significant concentrations of individual elements in the sample being analysed using trace analytical methods. This technique allows the analysis of almost all elements of the periodic table, which can be converted to solution with sensitivities ranging from ppb to hundreds of ppm.
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